LANDI ELIA

Teaching activities

Completion accademic year: 2023/2024

Course year: 3 First cycle degree (DM 270) COMPUTER AND INFORMATION ENGINEERING A.Y. 2021/2022
Course year: 3 First cycle degree (DM 270) COMPUTER AND INFORMATION ENGINEERING A.Y. 2021/2022

Completion accademic year: 2021/2022

Course year: 1 Second cycle degree (Laurea Magistrale) ELECTRONICS AND COMMUNICATIONS ENGINEERING A.Y. 2021/2022

Completion accademic year: 2020/2021

Course year: 1 Second cycle degree (Laurea Magistrale) ELECTRONICS AND COMMUNICATIONS ENGINEERING A.Y. 2020/2021

Research

Ultime pubblicazioni:

  • Landi, E., Lisini Baldi, T., Moretti, R., Papenbrock, J., Mugnaini, M., Prattichizzo, D., et al. (2024). A Method for Sensing Passive Joints of Robotic Extra Fingers for Trajectory Tracking. In 2024 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0 & IoT) (pp.562-567). New York : IEEE [10.1109/metroind4.0iot61288.2024.10584244]. - view more
  • Landi, E., Mugnaini, M., Vatansever, T., Fort, A., Vignoli, V., Giurranna, E., et al. (2024). Advancing Thrombosis Research: A Novel Device for Measuring Clot Permeability. SENSORS, 24(12) [10.3390/s24123764]. - view more
  • Landi, E., Moretti, R., Fort, A., Moschitta, A., Carbone, P. (2024). Accurate Fitting Techniques for QCM-D Response Analysis. In Conference Record - IEEE Instrumentation and Measurement Technology Conference. New York : IEEE [10.1109/I2MTC60896.2024.10561100]. - view more
  • Fort, A., Landi, E., Moretti, R., Mugnaini, M., Liguori, C., Paciello, V., et al. (2024). QCM measurement systems: Problems and performance analysis. In Conference Record - IEEE Instrumentation and Measurement Technology Conference. New York : IEEE [10.1109/I2MTC60896.2024.10561111]. - view more
  • Fort, A., Mugnaini, M., Landi, E., Macolic, S., Vatansever, T., Fiorillo, C., et al. (2024). A Measurement System for the Dynamic Assessment of Blood Clot Permeability. In 2024 IEEE International Symposium on Medical Measurements and Applications (MeMeA) (pp.1-6). New York : IEEE [10.1109/MeMeA60663.2024.10596927]. - view more